iapr

Newsletter 06

Hello everybody. For many of us, September is a month where things
begin to become very busy after a quiter summer period. One aspect of
this is a new mail from TC10, with information about several coming
events....

First, I hope that many of us will meet next month at ICDAR'93 in
Tsukuba Science City, Japan. Although official IAPR TC10 meetings are
to be held during ICPR, I propose that we hold an informal meeting
during this conference. Prof. Yamamoto, general chairman of the
conference, kindly reserved a room fot this purpose. So I am happy to
invite all of you who wish to attend and who will be at ICDAR to a
TC10 meeting on October 21, from 17:30 to 18:30 (just before the
banquet). We will mainly discuss the possibility to arrange a special
workshop on graphics recognition and technical drawings interpretation
in connection with ICDAR'95. So look out for the announcement of the
meeting (exact location, etc.) on the billboard at ICDAR.

ICDAR'95 will most probably be held in August 1995, in Montreal,
Canada. A formal announcement about this conference should be given at
ICDAR'93. In any case, we will come back to it later in this mailing
list.

But before thinking of 1995, there are events of interest for us in
1994. Of course, the main IAPR event will be ICPR, in Jerusalem (Oct.
9-13, 1994). The week after ICPR, there will also be a workshop on
document analysis, announced below:

----------------------------
CALL FOR PAPERS
International Association for Pattern Recognition Workshop on
Document Analysis Systems
Kaiserslautern, Germany
October 18-20, 1994

An intensive, three-day, single-track, 100%-participation workshop on
research and development of systems for the analysis of document images.

This workshop will take place during the week following the 12th
International Conference on Pattern Recognition (Jerusalem, Israel, October
9-13, 1994). Academic and industrial researchers, as well as end-users, are
encouraged to attend, and we hope to attract students as well as principal
investigators. We hope to supply scholarships for students.

Attendance will be limited to 75 people. Papers will be delivered in a
single-track format. Approximately half of the workshop will be devoted to
panel discussions and working groups. Participants are invited to propose
topics for these in advance. There will be ample opportunity for informal
discussion and socializing.

Sponsors
IAPR Technical Committee on Syntactic and Structural Pattern Recognition (TC-2)
IAPR Technical Committee on Text Processing (TC-11)
IAPR Technical Committee on Graphics Understanding (TC-10)
Daimler Benz

Topics
- descriptions of complete document image analysis systems
- applications to text, graphics, maps, logic diagrams, music, etc.
- studies of systems architecture
- methods for performance evaluation
- interfaces to knowledge databases and post-processors
If time permits, related topics will be considered, such as:
- algorithms for symbol recognition
- layout segmentation

Submission of Papers
Authors are invited to submit either a full paper or an abstract of remarks.
Full papers, of up to book-chapter length, will be presented formally,
published in a limited number of refereed Proceedings available at the
meeting, and considered for archival publication in a post-workshop book.

Abstracts of remarks, one page in length, will be delivered more briefly, and
will not be published in the Proceedings unless requested. Authors should
submit four copies of each paper or abstract, cleanly typed and in English.
If there are several authors, please indicate which author will handle all
correspondence.

Acceptance of a paper will result in the automatic distribution of
registration materials.

Send full papers or abstract submissions or inquiries or suggestions about
the technical program to:
Larry Spitz
Fuji Xerox Palo Alto Laboratory
3400 Hillview Avenue
Palo Alto, CA 94304 USA
TEL: +1(415)813-7767
FAX: +1(415)813-7081
EMAIL: This email address is being protected from spambots. You need JavaScript enabled to view it.

Workshop Organization

Chairs
Andreas Dengel DFKI, Kaiserslautern, Germany
Larry Spitz Fuji Xerox Palo Alto Laboratory, CA, USA

Program Committee
Henry Baird AT&T Bell Labs, Murray Hill, NJ, USA
Horst Bunke University of Bern, Switzerland
Richard Casey IBM Almaden, San Jose, CA, USA
Jonathan Hull CEDAR, University at Buffalo, NY, USA
Sebastiano Impedovo University of Bari, Italy
Hiromichi Fujisawa Hitachi Ltd., Yokohama, Japan
Junichi Kanai ISRI, UNLV, Las Vegas, NV, USA
Rejean Plamondon Ecole Polytechnique de Montreal, Canada
Juergen Schuermann Daimler Benz, Ulm, Germany
Karl Tombre INRIA & CRIN/CNRS, Nancy, France
Shuichi Tsujimoto Toshiba R&D, Kawasaki, Japan
Patrick Wang Northeastern University, MA, USA
Kazuhiko Yamamoto ETL, Tsukuba, Japan

Important Dates
April 1, 1994 Submission of full papers
June 15, 1994 Acceptance of full papers
July 1, 1994 Submission of abstracts
August 1, 1994 Acceptance of abstracts
August 15, 1994 Camera-ready copy
September 1, 1994 Registration payment and hotel reservation

Workshop Information
Information about the workshop will be available by file transfer
protocol, ftp:
ftp serv-200.dfki.uni-kl.de
or
ftp 131.246.241.100

UserID: anonymous
Password: <your mail address>
cd das94
get <...> fetching files
Other inquiries about local arrangements, registration and scholarships
should be directed to:
Andreas Dengel
German Research Center for Artificial Intelligence (DFKI)
P.O. Box 2080
67608 Kaiserslautern
Germany
TEL: +49(631)205-3215/16
FAX: +49(631)205-3210
EMAIL: This email address is being protected from spambots. You need JavaScript enabled to view it.


----------------------------
In the history of document analysis, many of us remember the
importance which has been played by the Structural and Syntactic
Pattern Recognition Workshops, especially SSPR90, in New Jersey, where
the basis was laid for the ICDAR conferences. So, although this
workshop is arranged by another Technical Committee, I forward here
their call for paper too. It is arranged just before ICPR, and will
also be held in Israel:

----------------------------
Call for Papers

SSPR'94
International Workshop on
Syntactic and Structural Pattern Recognition

October 4-6 1994
Technion - Israel Institute of Technology
HAIFA, ISRAEL

General Information:

Syntactic and structural pattern recognition encompasses all aspects
of pattern recognition that are related to the structure and/or syntax
of the patterns under consideration as a basis for their recognition.

SSPR'94 is the fifth workshop in a series of workshops organized by
the Technical Committee on SSPR of the International Association for
Pattern Recognition (IAPR), and held traditionally in conjunction with
the large IAPR International Conference on Pattern Recognition (ICPR),
held in October 1994 in Jerusalem.

The goal of this workshop is to provide a forum for discussing
issues related to syntactic and structural pattern recognition.
These issues include, but are not limited to, the following issues:

- General methodology.
- Machine learning and grammatical inference.
- Structured document image analysis: handwriting, maps, technical drawings.
- Speech and one-dimensional signal analysis.
- Structural methods in image processing.
- Shape analysis.
- Structural methods in computer vision.

We solicit contributions of two types:
- Research papers (extended abstracts limited to 10 double-spaced pages)
- Position papers (about any of the relevant issues).

The workshop will feature paper presentations, discussions and
panels based on position papers submitted, and invited speakers.

The abstracts of the papers will appear in a conference proceedings.
The papers presented at the Workshop will be published in a book format.

Important Dates in 1994:

March 1: Paper Submission.
June 1: Notification of Acceptance.
July 1: Final Abstract Submission.
Camera Ready Paper at the Workshop.

Program Committee

Co-Chairmen: Dov Dori and Alfred Bruckstein
H. Baird - AT&T Bell Labs, Murray Hill, NJ, USA
R. Basri - Weizmann Inst., Rehovot, Israel
H. Bunke - University of Bern, Switzerland
R.M. Haralick - University of Washington, Seattle, USA
H. Freeman - Rutgers University, NJ, USA
R. Kasturi - Penn. State, University Park, PA, USA
N. Kiryati - Technion, Haifa, Israel
M. Lindenbaum - Technion, Haifa, Israel
R. Mohr - Institut Polytechnique, Grenoble, France
H. Noltemeier, University of Wuerzburg, Germany
T. Pavlidis, SUNY at Stony Brook, NY, USA
A. Rosenfeld - U. of Maryland, College Park, USA
A. Sanfeliu - Polytechnic of Catalonia, Barcelona, Spain
G. Sanniti di Baja - NRC, Napoli, Italy
C.Y. Suen - Concordia University, Montreal, Canada
K. Tombre, INRIA Lorraine & CRIN/CNRS, Nancy, France
K. Yamamoto - Electrotechnical Laboratory, Japan
P.S.P. Wang - Northeastern, Boston, MA, USA
H. Wolfson - TAU, Tel Aviv, Israel

Workshop Secretariat:
Ms. Nilly Schnap
Faculty of Industrial Engineering and Management
Technion, Israel Institute of Technology
Technion City, Haifa 32000, ISRAEL
Tel. 972-4-294445; fax: 972-4-4-235194.

----------------------------
Finally, I am also pleased to announce an another 1994 workshop which
may be of interest to many of us: the 2nd int. workshop on visual form:
----------------------------
FINAL CALL FOR PAPERS
2nd INTERNATIONAL WORKSHOP ON VISUAL FORM
Capri, Italy
May 30 - June 2, 1994

The 2nd International Workshop on Visual Form (IWVF2) is organized
jointly by the Department of Computer Science and Systems of the University of
Naples and by the Institute of Cybernetics of the National research Council of
Italy, and is sponsored by the International Association for Pattern
Recognition.

IWVF2 Chairmen:
Carlo Arcelli, Istituto di Cibernetica, Arco Felice, Naples
Luigi P. Cordella, DIS-Universita' di Napoli, via Claudio 21, Naples
Gabriella Sanniti di Baja, Istituto di Cibernetica, Arco Felice, Naples

IWVF2 Scientific Committee:
K. Abe (Japan), S.V. Ablameyko (Belarus), A. Bruckstein (Israel), D.
Chetverikov (Hungary), L. De Floriani (Italy), L. Dorst (The Netherlands), M.
Ferretti (Italy), G. Granlund (Sweden), E. Granum (Denmark), R. Hall (USA), B.
Kimia (USA), J. Kittler (UK), W. Kropatsch (Austria), O. Kubler (Switzerland),
A.J. Maeder (Australia), E.E. Milios (Canada), A. Montanvert (France),
G. Musso (Italy), L. O'Gorman (USA), D. Rutovitz (UK), H. Samet (USA),
J. Serra (France), R. Stefanelli (Italy), C.Y. Suen (Canada),
A. Vossepoel (The Netherlands), P. Zamperoni (Germany)

The scientific program will include the presentation of invited talks
and contributed papers. The goal of IWVF2 is to provide a discussion forum for
researchers and practitioners interested in 2D and 3D shape analysis. Original
and unpublished work in all aspects of this field is welcome. Main topics
include:

Shape Perception Shape Representation Shape Decomposition
Shape Description Shape Recognition Other topics related to shape

Prospective contributors are encouraged to submit papers and to attend
IWVF2. Each paper will be reviewed by the Scientific Committee members by using
a blind procedure, implying that the identities of the authors will not be
known to the reviewers. Accepted papers will be discussed in a single track, or
presented as posters. All the presented contributions will be included in the
proceedings volume, which will be published in book form after the workshop.

Invited talks will be given by:
Dana H. Ballard (USA) Gunilla Borgefors (Sweden)
Jan-Olof Eklundh (Sweden) Robert M. Haralick (USA)
Rangachar Kasturi (USA) Martin D. Levine (Canada)
Theo Pavlidis (USA) Shmuel Peleg (Israel)
Steve W. Zucker (Canada)

Important dates:
November 1, 1993: Submission of contributions
March 1, 1994: Notification of acceptance
May 1, 1994: Camera-ready paper due


PAPER SUBMISSION:
Authors should send four copies of a full paper to the IWVF2 Scientific
Secretariat, before November 1, 1993. Paper length should be limited to about
4000 words, since this is the estimated length of the proceedings version. The
first page should be anonymous, containing only the title of the paper, a
200-word abstract and 3-5 key words. A separate page including the title, the
name(s) and affiliation(s) of the author(s), the abstract, the keywords, and
the addressed topic of the workshop must accompany the paper. Papers submitted
by telefax or email will not be reviewed.

IWVF2 Scientific Secretariat
Istituto di Cibernetica, CNR
Via Toiano 6
80072 Arco Felice, Naples
ITALY

REGISTRATION FEE:
The registration fee is 600.000 Italian lire, if paid by March 31,
1994, and 700.000 Italian lire afterwards. Members of IAPR are given a 5%
discount. The registration fee includes admission to the scientific sessions,
lunches and coffee breaks, the proceedings book, and the social program. The
fee for accompanying persons is 300.000 Italian lire, and covers the social
program.

For further information contact the Scientific Secretariat at the above
address, or use Fax +39 81 5267654, or Email This email address is being protected from spambots. You need JavaScript enabled to view it.

______________________________________________________________________________
Dr. Gabriella Sanniti di Baja
Istituto di Cibernetica, CNR
Via Toiano 6
80072 Arco Felice (Napoli) ITALY

Telephone: +39 81 8534237
FAX: +39 81 5267654
e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
This email address is being protected from spambots. You need JavaScript enabled to view it.
-------------------------------------
So if you have original work relevant for one of those events, you
now have the deadlines and you can start writing...

Looking forward to meeting many of you in Tsukuba,

Your IAPR TC10 chairman,

--
Karl Tombre - INRIA Lorraine / CRIN-CNRS --- Email: This email address is being protected from spambots. You need JavaScript enabled to view it.
Post: Batiment LORIA, BP 239, 54506 Vandoeuvre CEDEX, France --or--
615 rue du jardin botanique, BP 101, 54602 Villers CEDEX, France
Phone: +33 83.59.20.71 --- Fax: +33 83.41.30.79 --or-- +33 83.27.83.19